Back to search

Virginia Tech

The effect of response distortion on the accuracy of predictive inferences of personality inventories

Abstract

dc:description.abstract

The effects of faking on the predictive ability of the CPI and social desirability (SD) scale were assessed. Three hundred and twenty-two subjects were asked to respond to the CPI and the SD scale twice, once responding honestly, and once faking to create socially desirable self-images. Results indicate that subjects could successfully distort their responses on all scales. Depending on the scale characteristics, faking could both reduce as well as increase scale variability and reliability. People who are highly intelligent did not distort their responses any better than people of lower intelligence. Furthermore, response distortion was found to have negative effects on valid scales. It did not affect scales that had no predictive ability. However, for certain scales, faking could improve the likelihood of those scales to predict performance when the amount of faked responses in the sample was between 10% and 30%. Implications for organizations and for further research were also discussed.

Degree

thesis:*
Name thesis:degree_name
Master of Science
Level thesis:degree_level
masters
Discipline thesis:degree_discipline
Psychology
Department dc:contributor.department
Psychology
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1995

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Ni, Yuqing

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-06162009-063658
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/43358

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Ni, Yuqing. The effect of response distortion on the accuracy of predictive inferences of personality inventories. masters thesis, Virginia Tech, 1995. http://hdl.handle.net/10919/43358