Abstract
dc:description.abstractAn X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concentration-penetration curves across the diffusion zone. the experimental curves are in general agreement with a new mathematical analysis and also the diffusion coefficients reported in the literature.
Degree
thesis:*- Name thesis:degree_name
- Master of Science
- Level thesis:degree_level
- masters
- Discipline thesis:degree_discipline
- Metallurgical Engineering
- Department dc:contributor.department
- Metallurgical Engineering
- Grantor dc:publisher
- Virginia Tech
- Year dc:date.issued
- 1965
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Braski, David N.
- Chair dc:contributor.committeechair
-
- Houska, Charles R.
Rights
dc:rights- Statement dc:rights
-
- In Copyright
- Licence dc:rights.uri
Identifiers
dc:identifier.*- Dc Identifier Other
- etd-02162010-020508
- OAI identifier oai:identifier
- oai:vtechworks.lib.vt.edu:10919/41203