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Virginia Tech

Factors, including curriculum, that relate to test anxiety experienced by secondary students: a study based on High school and beyond

Abstract

dc:description.abstract

In education, tests are used as indications of students' success or failure. Inferior test performance has been shown to be associated with the debilitating effects of evaluation stress. An educator's task is to provide opportunities for students to enjoy learning experiences that allow for success. Teachers must, therefore, be aware of factors that might impede this process. The purpose of this study was to determine levels of test anxiety (TA) perceived to be experienced by secondary students, as well as the relationship to TA of students' personal characteristics, home environment characteristics, participation in co- and extra-curricular activities, performance on cognitive tests, and curriculum type. The sample used for the third fol1owup of the High School and Beyond (HSB) 1980 Senior Cohort (n=ll,995) was examined for this study. A TA index was constructed using data from three questions from Section 7 of the HSB cognitive test. Results of item analysis and Kuder-Richardson Internal Consistency Reliability Estimate (KR-20) indicated that the index had internal consistency and low to moderate reliability. A second item analysis, using supplemental variables, indicated that the index was valid. Transformation of student responses to TA index items, assigned students TA scores ranging from -13 to +13, with -13 representing the minimum level of TA. Only six (.01%) of the students scored +13, the highest TA level. TA scores for 11% of the students indicated high levels.

Degree

thesis:*
Name thesis:degree_name
Doctor of Education
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Vocational and Technical Education
Department dc:contributor.department
Vocational and Technical Education
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1991

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Evers-Lush, Mary Jean
Chair dc:contributor.committeechair
  • Schmidt, B. June
Committee members dc:contributor.committeemember
  • Camp, William G.
  • Hillison, John H.
  • Lipscomb, Thomas J.
  • Schnitzer, Martin C.
  • Stewart, Jeffrey R.
  • Strickland, Deborah C.

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-10142005-103110
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/39878

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Evers-Lush, Mary Jean. Factors, including curriculum, that relate to test anxiety experienced by secondary students: a study based on High school and beyond. doctoral thesis, Virginia Tech, 1991. http://hdl.handle.net/10919/39878