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Virginia Tech

An efficiency rating tool for process-level VHDL behavioral models

Abstract

dc:description.abstract

Due to the great complexity of VHDL models that are created today, the amount of processing time required to simulate these models and the amount of labor required to develop these models have become critical issues. The amount of processing time required to simulate a model can be directly influenced by the efficient use of VHDL concepts in creating the model. This dissertation presents an approach to aiding the modeler in the development of more efficient VHDL models. This is done by measuring the simulation efficiency of process-level VHDL behavioral models. Research in the determination of what VHDL constructs and modeling styles are most efficient is presented. The development and use of a tool that parses VHDL behavioral models and reveals the efficiency of the code in the form of a numerical efficiency rating is also presented.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Electrical Engineering
Department dc:contributor.department
Electrical Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
1996

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Wicks, John A.
Chair dc:contributor.committeechair
  • Armstrong, James R.
Committee members dc:contributor.committeemember
  • Cyre, Walling R.
  • Midkiff, Scott F.
  • Gray, F. Gail
  • Parry, Charles J.

Subjects

dc:subject × 5

Rights

dc:rights
Statement dc:rights
  • In Copyright
Language dc:language.iso
en

Identifiers

dc:identifier.*
Dc Identifier Other
etd-06062008-151205
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/37990

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Wicks, John A.. An efficiency rating tool for process-level VHDL behavioral models. doctoral thesis, Virginia Tech, 1996. http://hdl.handle.net/10919/37990