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Virginia Tech

Development of a Novel Planar Mie Scattering Method for Measurement of Spray Characteristics

Abstract

dc:description.abstract

The work herein details an optical droplet measurement system based on planar multi-angle Mie scattering. Sizing information consists of a mean droplet diameter and droplet distribution estimates for every individual point within a planar (2D) area of interest. The planar method makes possible the fast acquisition of data within a large field of interest, and uses relatively inexpensive instrumentation. As presented, the method demonstrated the ability to measure water droplets from a typical simplex spray nozzle, across the range of 5-50 micrometers within +/-10% of known values, and in addition return an estimate of the shape and width of the size distribution at each location within the planar region of interest. Measurements demonstrating the agreement between results from this current method and known PDA data were successfully completed for a 1-gallon-per-hour spray nozzle, and repeatability was demonstrated in 2.5-gallon-per-hour and 4.5-gallon-per-hour nozzles. Additionally the limits of the technique are explored with simulated data. Conclusions from these exercises show that the multi-angle planar Mie scattering method is capable of measuring droplet distribution characteristics and means within a nominal range of 0.3 micrometers up to 150 micrometers.

Degree

thesis:*
Name thesis:degree_name
Ph. D.
Level thesis:degree_level
doctoral
Discipline thesis:degree_discipline
Mechanical Engineering
Department dc:contributor.department
Mechanical Engineering
Grantor dc:publisher
Virginia Tech
Year dc:date.issued
2012

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • LePera, Stephen D.
Chair dc:contributor.committeechair
  • Vandsburger, Uri
Committee members dc:contributor.committeemember
  • O'Brien, Walter F. Jr.
  • Ng, Fai
  • Ekkad, Srinath V.
  • Cohen, Jeffrey

Subjects

dc:subject × 11

Rights

dc:rights
Statement dc:rights
  • In Copyright

Identifiers

dc:identifier.*
Dc Identifier Other
etd-02072012-101235
OAI identifier oai:identifier
oai:vtechworks.lib.vt.edu:10919/26143

Chain of custody

source
Harvested from
Virginia Tech
Base URL
vtechworks.lib.vt.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

LePera, Stephen D.. Development of a Novel Planar Mie Scattering Method for Measurement of Spray Characteristics. doctoral thesis, Virginia Tech, 2012. http://hdl.handle.net/10919/26143