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University of Illinois - Urbana-Champaign

Infrared detection properties of Si P-I-N diodes doped with deep levels

Abstract

dc:description

Made available in DSpace on 2017-11-30T22:11:07Z (GMT). No. of bitstreams: 2 6070599.pdf: 33209903 bytes, checksum: 162575177826612629aa81702d567d78 (MD5) license.txt: 4813 bytes, checksum: 715c4321821a960fa1a1e91d2ac7ebce (MD5) Previous issue date: 1969

Degree

thesis:*
Name thesis:degree_name
M.S. (master's)
Level thesis:degree_level
Thesis
Discipline thesis:degree_discipline
Electrical Engineering
Year dc:date
2017

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Maher, Anthony Thomas

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • Copyright 1969 Anthony Thomas Maher
Language dc:language
en

Identifiers

dc:identifier.*
Identifier
6070599
ocn489510294
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/98605

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Maher, Anthony Thomas. Infrared detection properties of Si P-I-N diodes doped with deep levels. Thesis thesis, 2017. http://hdl.handle.net/2142/98605