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University of Illinois at Urbana-Champaign

Fluctuation Electron Microscopy of Medium -Range Order in Amorphous Silicon

Abstract

dc:description

Experiments also show that hydrogenated amorphous silicon deposited by a variety of methods shares the paracrystalline structure. The medium-range order of hydrogenated amorphous silicon is affected by exposure to visible-spectrum white light. Films deposited by different methods have different responses, which may be connected to differences in the creation of metastable electrical defects known as the Staebler-Wronski effect.

Degree

thesis:*
Name thesis:degree_name
Ph.D.
Level thesis:degree_level
Dissertation
Discipline thesis:degree_discipline
Physics
Grantor
University of Illinois at Urbana-Champaign
Year dc:date
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Voyles, Paul Marriner
Contributors dc:contributor
  • Gibson, J.M.

Subjects

dc:subject × 1

Rights

Language dc:language
eng

Identifiers

dc:identifier.*
Identifier
(MiAaPQ)AAI9996700
OAI identifier oai:identifier
oai:www.ideals.illinois.edu:2142/80698

Chain of custody

source
Harvested from
University of Illinois - Urbana-Champaign
Base URL
www.ideals.illinois.edu/oai-pmh
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Voyles, Paul Marriner. Fluctuation Electron Microscopy of Medium -Range Order in Amorphous Silicon. Dissertation thesis, University of Illinois at Urbana-Champaign, 2015. http://hdl.handle.net/2142/80698