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University of Illinois - Urbana-Champaign
Quantitative electron microscopy studies of Si1̳-̳x̳Gex̳/Si(001)
Abstract
dc:descriptionSubmitted by William Weathers (weathrs2@illinois.edu) on 2012-05-29T17:45:52Z No. of bitstreams: 1 2000_henstrom.pdf: 3882806 bytes, checksum: 70e7dde2d784aba4da0f6cf7c40795f4 (MD5)
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Year dc:date
- 2012
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Henstrom, William Lee
- Contributors dc:contributor
-
- Gibson, J. Murray
Subjects
dc:subject × 4Rights
dc:rights- Statement dc:rights
-
- ©2000 Henstrom
- Language dc:language
- en
Identifiers
dc:identifier.*- Identifier
- 4360624
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/31253