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University of Illinois - Urbana-Champaign
X-ray generation by MeV electrons in silicon: Temperature, tilt and thickness dependence
Abstract
dc:descriptionSubmitted by Carolyn Mead (cmead2@illinois.edu) on 2011-06-16T14:05:29Z No. of bitstreams: 1 1982_kozlowski.pdf: 1872877 bytes, checksum: 090763a400cc816d2a1cdf9a1bbe79bb (MD5)
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Physics
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Kozlowski, Robert Edward
- Contributors dc:contributor
-
- Koehler, James S.
Subjects
dc:subject × 4Rights
dc:rights- Statement dc:rights
-
- 1982 Robert Edward Kozlowski
- Language dc:language
- en
Identifiers
dc:identifier.*- Identifier
- 88456
- OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/25416