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University of Illinois at Urbana-Champaign
Design, diagnosis and reconfiguration of defect-tolerant VLSI
Abstract
dc:descriptionThis thesis examines three specific issues of defect-tolerant VLSI: (1) design and reconfiguration of defect-tolerant linear arrays, (2) diagnosis and reconfiguration of memory chips with spare rows/columns, and (3) optimal diagnosis procedures for k-out-of-n structures.
Degree
thesis:*- Name thesis:degree_name
- Ph.D.
- Level thesis:degree_level
- Dissertation
- Discipline thesis:degree_discipline
- Computer Science
- Grantor
- University of Illinois at Urbana-Champaign
- Year dc:date
- 2011
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Chang, Ming-Feng
- Contributors dc:contributor
-
- Fuchs, W. Kent
Subjects
dc:subject × 2Rights
dc:rights- Statement dc:rights
-
- Copyright 1991 Chang, Ming-Feng
- Language dc:language
- eng
Identifiers
dc:identifier.*- Identifier
-
AAI9124391
(UMI)AAI9124391 - OAI identifier oai:identifier
- oai:www.ideals.illinois.edu:2142/19672