I. A New Technique of X-Ray Microradiography. II. Quantitative Evaluation of Crystalline Distortion and Fatigue by X-Ray Diffraction

Shafer, William McKinley

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University of Illinois at Urbana-Champaign

I. A New Technique of X-Ray Microradiography. II. Quantitative Evaluation of Crystalline Distortion and Fatigue by X-Ray Diffraction

dc:creator Shafer, William McKinley

thesis:degree_name Ph.D. (doctoral)

dc:date1940

Degree

thesis:*

Name thesis:degree_name: Ph.D. (doctoral)
Level thesis:degree_level: Dissertation
Grantor: University of Illinois at Urbana-Champaign
Year dc:date: 1940

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Shafer, William McKinley

Subjects

dc:subject × 1

Radiography

Rights

Language dc:language: eng

Identifiers

dc:identifier.*

Handle dc:identifier: https://hdl.handle.net/2142/123598
OAI identifier oai:identifier: oai:www.ideals.illinois.edu:2142/123598

Chain of custody

source

Harvested from: University of Illinois - Urbana-Champaign
Base URL: www.ideals.illinois.edu/oai-pmh
Last updated: 2026-07-22
Source record: OAI-PMH GetRecord

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citation

Shafer, William McKinley. I. A New Technique of X-Ray Microradiography. II. Quantitative Evaluation of Crystalline Distortion and Fatigue by X-Ray Diffraction. Dissertation thesis, University of Illinois at Urbana-Champaign, 1940. https://hdl.handle.net/2142/123598

I. A New Technique of X-Ray Microradiography. II. Quantitative Evaluation of Crystalline Distortion and Fatigue by X-Ray Diffraction

Degree

Author and committee

Subjects

Rights

Identifiers

Chain of custody

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