Anodic Stripping Voltammetry of Tellurium (IV) in 1.0M NH4, SCN at Rotating Disk Gallium - Thin-Film Electrode.

The electroanalytical technique of anodic stripping voltammetry (ASV), using a gallium-thin film electrode in 1.0M NH4SCN at 60°C has been applied to study the electroanalytical chemistry of Te(IV). Both externally plated and in-situ plated thin-film gallium on rotating glassy carbon disk electrodes are presented. Detection limits of Te(IV) on various monolayer equivalents of gallium plated on a solid glassy carbon electrode are also presented. The sensitivity of this method, which is 1x10-9 TE(IV), is comparable to that of anodic stripping voltammetry using gold-plated electrodes.

Level thesis:degree_level

Thesis

Year

1981

Author dc:creator

• Olayiwola, Mojeed Tunde

• Anodic stripping voltammetry
• Electroanalytical chemistry
• Solid glassy carbon electrode
• Gold-plated electrodes
• Gallium-thin film electrode

Repository record dc:identifier

https://digitalcommons.library.uab.edu/etd-collection/7111

OAI identifier oai:identifier

oai:digitalcommons.library.uab.edu:etd-collection-8103