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The University of Texas at Austin

Controlling work in process during semiconductor assembly and test operations

Abstract

dc:description.abstract

In the semiconductor industry, products go through a series of steps over a three- to four-month period that begins with the fabrication of chips and ends with assembly and test (AT) and shipment. This paper introduces a mid-term planning model for scheduling AT operations aimed at minimizing the difference between customer demand and product completions each day. A secondary objective is to maximize daily throughput. Typically, semiconductor companies have 1000s of products or devices in their catalog that can be organized into unique groups of up to 100 devices each. This simplifies the planning process because it is only necessary to consider the groups as a whole rather than the individual devices when constructing schedules. In all, we developed and tested three related models. Each provides daily run rates at each processing step or logpoint for each device group for up to one month at a time. The models are distinguished by how cycle time is treated. The first takes a steady-state approach and uses Little’s Law to formulate a WIP target constraint based on the average cycle time at each processing step. The second and third include integer and fractional cycle times in the variable definitions. To find solutions, raw production data are analyzed in a preprocessing step and then converted to input files in a standard format. FlopC++ from the COIN-OR open source software project is used to write and solve the model. Testing was done using three datasets from the Taiwan AT facility of a global semiconductor firm. By comparing model output with historical data for 6 device groups and 33 logpoints, we were able to realize decreases in shortages of up to 40% per month.

Degree

thesis:*
Name thesis:degree_name
Master of Science in Engineering
Level thesis:degree_level
Masters
Discipline thesis:degree_discipline
Operations Research and Industrial Engineering
Grantor
The University of Texas at Austin
Year dc:date.issued
2017

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Zhang, Chuwen, active 21st century
Advisor dc:contributor.advisor
  • Bard, Jonathan F.
Committee member dc:contributor.committeemember
  • Chacon, Rodolfo

Subjects

dc:subject × 3

Rights

Language dc:language.iso
en

Identifiers

dc:identifier.*
OAI identifier oai:identifier
oai:repositories.lib.utexas.edu:2152/62683

Chain of custody

source
Harvested from
University of Texas
Base URL
repositories.lib.utexas.edu/server/oai/request
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
citation

Zhang, Chuwen, active 21st century. Controlling work in process during semiconductor assembly and test operations. Masters thesis, The University of Texas at Austin, 2017. http://hdl.handle.net/2152/62683