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COMBINING MARKOV RANDOM FIELD AND MARKED POINT PROCESS FOR MICROSCOPY IMAGE MODELING

dc:creator Zhao, Huixi

thesis:degree_name Doctor of Philosophy (PhD)

2016

Abstract

dc:description.abstract

In many microscopy image analysis applications, it is of critical importance to address

Degree

thesis:*

Name thesis:degree_name: Doctor of Philosophy (PhD)
Level thesis:degree_level: Dissertation
Discipline thesis:degree_discipline: Electrical and Computer Engineering
Year: 2016

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Zhao, Huixi
Contributors dc:contributor: Mary L. Comer
Charles A. Bouman
Edward J. Delp
Mark R. Bell

Subjects

dc:subject × 4

Identifiers

dc:identifier.*

Repository record dc:identifier: https://docs.lib.purdue.edu/open_access_dissertations/1377
OAI identifier oai:identifier: oai:docs.lib.purdue.edu:open_access_dissertations-2593

Chain of custody

source

Harvested from: Purdue University
Base URL: docs.lib.purdue.edu/do/oai/
Last updated: 2026-07-24
Source record: OAI-PMH GetRecord

related terms

citation

Zhao, Huixi. COMBINING MARKOV RANDOM FIELD AND MARKED POINT PROCESS FOR MICROSCOPY IMAGE MODELING. Dissertation thesis, 2016. https://docs.lib.purdue.edu/open_access_dissertations/1377

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