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National University of Singapore

THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S

dc:creator HOON SIEW KUOK
dc:date.issued1998

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • HOON SIEW KUOK

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Harvested from
National University of Singapore
Base URL
scholarbank.nus.edu.sg/oai/request
Last updated
2026-07-24
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OAI-PMH GetRecord
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citation

HOON SIEW KUOK. THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S. 1998.

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