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North Carolina State University

Structural Characterization of III-Nitride Semiconductors: Defect Control and Strain Management.

dc:creator Guan, Yan
dc:date.issued2022

Abstract

dc:description

North Carolina State University Theses Material Science & Engineering.

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Guan, Yan
Advisors dc:contributor.advisor
  • Zlatko Sitar, Co-Chair
  • Ramon Collazo, Co-Chair
  • Wenpei Gao, Member
  • Leda Lunardi, Member

Identifiers

dc:identifier.*
Dc Identifier Other
deg28185
OAI record oai:identifier
https://repository.lib.ncsu.edu/server/oai/request?verb=GetRecord&metadataPrefix=dim&identifier=oai%3Arepository.lib.ncsu.edu%3A1840.20%2F39442

Chain of custody

source
Harvested from
North Carolina State University
Base URL
repository.lib.ncsu.edu/server/oai/request
Last updated
2026-08-21
Source record
OAI-PMH GetRecord
related terms
citation

Guan, Yan. Structural Characterization of III-Nitride Semiconductors: Defect Control and Strain Management.. 2022. https://www.lib.ncsu.edu/resolver/1840.20/39442

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