Application of critical chain to staged software development

One in three IT projects are canceled before they are completed. Of the projects that are completed, over 75% are late, over budget or are released with reduced functionality. Average cost overruns are 189%; average schedule overruns are 222% (The Standish Group). The software development process and the project management techniques are critical components in completing a development project on time and on budget. Critical Chain Project Management techniques and a Staged Development process were designed to address issues that contribute to the large number of schedule and cost overruns. Critical Chain is based on Theory of Constraint principles developed by Eliyahu Go ldratt. Critical Chain offers practical methods for planning, scheduling, tracking and mitigating schedule risk in a development program. Staged Development, a form of an incremental product development lifecycle, is considered to be a software development best practice. Staged Development promises faster development schedules, increase progress visibility and higher quality. In this study the author researches, applies and analyzes the Critical Chain and Staged Development methodologies. The combination of the two methodologies created a process that served to increase likelihood of project success.

Department dc:contributor.department

System Design and Management Program

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

1999

Author dc:creator

• Pepin, Ronald (Ronald Raymond), 1961-

Advisor dc:contributor.advisor

• Steven D. Eppinger.

• System Design and Management Program

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/9750

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/9750