Design, development and characterization of an integrated multispectral polarimetric sensor system

In this thesis, a new type of integrated imaging sensor is introduced to detect multispectral and polarimetric signatures in an infrared scene. The sensor is a stack consisting of an infrared detector array, and an array of multispectral and polarimetric filters. In this first phase of the research, a single-pixel sensor was built. Multispectral filters were initially fabricated for the 3-5 micron waveband on sapphire substrates and polarimetric filters on silicon substrates. These were characterized separately and in mechanical contact as a single unit. The transmission characteristics of both filters show excellent agreement with the theoretical results. When the filters are integrated into an imaging sensor, such a sensor is anticipated to improve image contrast with sensor-fusion post processing. In addition, it will offer portability and robustness because of its integrated nature.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2001

Author dc:creator

• Kim, Dong-Hyun C. (Dong-Hyun Charles), 1969-

Advisor dc:contributor.advisor

• Cardinal Warde.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/8563

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/8563