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Massachusetts Institute of Technology

On the design of single electron transistors for the measurement of spins in phosphorus doped silicon

Abstract

dc:description.abstract

Phosphorus doped silicon is a prime candidate for spin based qubits. We plan to investigate a novel hybrid technique that combines the advantages of spin selective optical excitations with that of electrical readout measurements to detect spin defects in semiconductors. In this thesis, I present my work on the design and fabrication of single electron transistors (SETs) for the electrical readout of the spin state of phosphorus doped silicon. For such highly sensitive measurements, it is necessary for the characteristic energy of the SET to be larger than thermal fluctuations. My goal was to design and fabricate SETs on P doped Si that function at temperatures of about 2K. This necessitated minimizing the tunnel junction area through optimized lithography and evaporation procedures. I have produced SETs with charging energies of - 0.85 meV corresponding to a temperature of ~ 10 K. These SETs have a charge sensitivity of ~ 2 x 10 -⁴ e/[square root]Hz at 10 mK but have yet to be tested at temperatures of 2K. The mechanism of detection involves exciting the P donor to a P+ ion that then shifts the electrochemical potential near the SET, creating a sharp peak in the current through the SET. This can ultimately be used for single shot readout and thus for a measurement of the spin state of the electron - a promising system for quantum computation, magnetometry and spintronics.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Physics.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2012

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Randeria, Mallika
Advisor dc:contributor.advisor
  • Amir Yacoby and Pablo Jarillo-Herrero.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/78520
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/78520

Chain of custody

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Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
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citation

Randeria, Mallika. On the design of single electron transistors for the measurement of spins in phosphorus doped silicon. Massachusetts Institute of Technology, 2012. http://hdl.handle.net/1721.1/78520