EPCglobal : a universal standard

This thesis evaluates the likelihood of EPCglobal becoming the universal RFID standard by presenting a framework of ten factors used to analyze and determine if EPCglobal is moving in the right direction. The ten factors are: complexity of application (Supply Chain Management), mandates, privacy policy, member type, EPCglobal standard development process, membership size, intellectual property policy, benefits, system cost, and China. These factors have been used in various analyses and studies that explain the main reasons for the adoption of other technologies and/or standards. Therefore, this thesis not only presents an analysis for the adoption of EPCglobal as the universal standard but also presents the factors that could help EPCglobal achieve its goal. The results show that five of the ten factors that influence the establishment of EPCglobal as the universal standard have a positive effect for the universal adoption of EPCglobal, two are neutral, and three are negative. Thus, there is a strong likelihood that EPCglobal could successfully become the universal standard for RFID system in the retail supply chain management. Furthermore, if EPCglobal strives to have the two neutral rated factors join the other five positive factors and makes an effort to switch the three negative factors to positive, then EPCglobal would be on the right path to becoming the universal standard.

Department dc:contributor.department

System Design and Management Program.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2007

Author dc:creator

• Aguirre, Juan Ignacio

Advisor dc:contributor.advisor

• Stuart E. Madnick.

• System Design and Management Program.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/42350

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/42350