An integrated methodology for the performance and reliability evaluation of fault-tolerant systems

This thesis proposes a new methodology for the integrated performance and reliability evaluation of embedded fault-tolerant systems used in aircraft, space, tactical, and automotive applications. This methodology uses a behavioral model of the system dynamics, similar to the ones used by control engineers when designing the control system, but incorporates additional artifacts to model the failure behavior of the system components. These artifacts include component failure modes (and associated failure rates) and how those failure modes affect the dynamic behavior of the component. The methodology bases the system evaluation on the analysis of the dynamics of the different configurations the system can reach after component failures occur. For each of the possible system configurations, a performance evaluation of its dynamic behavior is carried out to check whether its properties, e.g., accuracy, overshoot, or settling time, which are called performance metrics, meet system requirements. Markov chains are used to model the stochastic process associated with the different configurations that a system can adopt when failures occur.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2007

Author dc:creator

• Domínguez-García, Alejandro D. (Alejandro Dan)

Advisor dc:contributor.advisor

• John G. Kassakian and Joel E. Schindall.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/40496

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/40496