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Massachusetts Institute of Technology

Implementing variation risk management during product development

Abstract

dc:description.abstract

All manufactured systems exhibit some degree of variation. Manufacturing organizations should be aware of those parameters whose variation will impact product performance and customer satisfaction. Such parameters are called Key Characteristics. Their variation plays a large part in the success of manufacturing programs; planning for too little variation can lead to low production yields, while planning for too much variation can lead to over-design. The chance for low yields or over-design is referred to as variation risk. Although most companies realize the importance of understanding variation, many still have difficulty implementing variation risk management programs. For some the challenge lies in changing the organizational culture to operate in a concurrent engineering environment that implements variation risk management. For others who are ready to make the change, the challenge is more technical in nature: even if Key Characteristics can be identified, their variation may not be known, especially if used in a new product whose sub-systems have never been through the production line.

Degree

thesis:*
Department dc:contributor.department
Leaders for Manufacturing Program at MIT
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2007

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Padgalskas, Nicholas (Nicholas Keith)
Advisor dc:contributor.advisor
  • Daniel Whitney and Roy Welsch.

Subjects

dc:subject × 3

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/39684
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/39684

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Padgalskas, Nicholas (Nicholas Keith). Implementing variation risk management during product development. Massachusetts Institute of Technology, 2007. http://hdl.handle.net/1721.1/39684