Application of commercial best practices for new technology development within the constraints of defense contract funded R&D

This thesis explores the application of commercial best practices for new technology development within the constraints of the defense contract funded research and development (R&D) environment. Key elements of successful new product development (NPD) are identified from the literature, including strategic fit, organizational structure, financial considerations, and use of Stage-GateTM type processes. Constraints, conflicts, and issues which arise in the defense contract funded R&D world but not in the commercial world are explored, including a multiplicity of funding sources, short funding cycles, and ambiguous ownership of go/kill decisions and gating criteria. Existing defense industry Technology Readiness Level (TRL) and new Engineering and Manufacturing Readiness Level (EMRL) and Manufacturing Readiness Level (MRL) metrics are evaluated as potential gating mechanisms relevant to the defense industry. We determine that the EMRL and MRL metrics meet many of the criteria necessary for good NPD gates, but they must still be supplemented by commercial best practices such as ensuring strategic fit, good organizational structure, financial attractiveness and competitive evaluation.

Department dc:contributor.department

Sloan School of Manufacturing.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2007

Author dc:creator

• Davis, Monica K. (Monica Karin)

Advisor dc:contributor.advisor

• Duane S. Boning and Charles H. Fine.

• Engineering Systems Division.
• Sloan School of Manufacturing.
• Leaders for Manufacturing Program.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/39331

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/39331