Quantifying the source of reentrant line variability and the effects of processes standardization on tool availability variability

This thesis quantifies the sensitivity of tool availability variability with respect to product throughput and examines how Intel's High Precision Maintenance initiative can be used to minimize these effects. Tools with variable availability release spikes of material into a route which can cause down stream areas to experience irregular queues. The reentrant multi product loops typical to Intel's manufacturing processes can make it difficult to identify the source of long queues. The variability analysis, developed during the internship uses D2 facility availability and cycle time data to generate a variability correlation, called TAC-TOOT which identifies tools within the facility contributing to throughput time. The High Precision Maintenance initiative is an Intel developed program which focuses on the standardization of maintenance processes. The success of the High Precision Maintenance initiative is closely linked to the ability of factory management to motivate equipment technicians. The thesis examines a number of tools with highly variable availability, the effects of the high precision initiative on variability and levers factory management can use to motivate technicians.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Civil and Environmental Engineering.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2007

Author dc:creator

• Peavey, Milo Camp

Advisor dc:contributor.advisor

• Roy E. Welsch and David Simchi-Levi.

• Civil and Environmental Engineering.
• Sloan School of Management.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/39287

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/39287