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Massachusetts Institute of Technology
Design of an automatic defect tracking and yield reporting system for the manufacturing floor
Abstract
dc:descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1994.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Dept. of Mechanical Engineering
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 1994
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Lee, Edward Matthew
- Advisor dc:contributor.advisor
-
- Kevin Otto, Roy E. Welsch.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/37739
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/37739