Back to search

Massachusetts Institute of Technology

Patent Visibility and the Diffusion of Trapped Knowledge: Evidence from US Grants

Abstract

dc:description.abstract

Valuable knowledge developed in one part of the world may remain “trapped" locally due to frictions in how knowledge is recognized and shared globally. This paper examines how granting US patents to foreign-origin inventions—by elevating their visibility and credibility— untraps the knowledge and facilitates global diffusion. Using examiner leniency as an instrument, complemented by a difference-in-differences design, I find that US grants of home country patents significantly increase both the likelihood and intensity of forward citations, including marked increases from third countries. A novel measure of “trappedness” reveals that knowledge from historically more trapped countries and sectors sees larger diffusion benefits after the US grants. These findings highlight the central role of the US as a platform of global knowledge recognition and diffusion, particularly in turning overlooked ideas into globally relevant innovations.

Degree

thesis:*
Name thesis:degree_name
Master
Department dc:contributor.department
Sloan School of Management
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2025

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Yao, Randol H.
Advisor dc:contributor.advisor
  • Li, Danielle

Rights

dc:rights
Statement dc:rights
  • In Copyright - Educational Use Permitted
  • Copyright retained by author(s)

Identifiers

dc:identifier.*
Handle dc:identifier.uri
https://hdl.handle.net/1721.1/164560
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/164560

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
related terms
citation

Yao, Randol H.. Patent Visibility and the Diffusion of Trapped Knowledge: Evidence from US Grants. Massachusetts Institute of Technology, 2025. https://hdl.handle.net/1721.1/164560