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Massachusetts Institute of Technology

X-ray studies of strained overlayers

Abstract

dc:description

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1989.

Degree

thesis:*
Name thesis:degree_name
Doctoral
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
1989

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Capano, Michael Anthony.
Advisor dc:contributor.advisor
  • Linn W. Hobbs and D. Keith Bowen.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.

Identifiers

dc:identifier.*
Handle dc:identifier.uri
https://hdl.handle.net/1721.1/130223
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/130223

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Capano, Michael Anthony.. X-ray studies of strained overlayers. Massachusetts Institute of Technology, 1989. https://hdl.handle.net/1721.1/130223