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Massachusetts Institute of Technology

Engineering strong-field phenomena : from attosecond pulse characterization to nanostructured electron emitters

Abstract

dc:description.abstract

Strong-field phenomena are a driving force behind the latest innovations in ultrafast science. As ultrafast laser sources improve in terms of peak pulse energy and wavelength tunability, applications that utilize high peak electromagnetic field strengths to generate attosecond pulses of both photons and electrons are becoming readily available. Furthermore, through the coupling of these optical fields to nanostructures that further enhance peak field strengths, a new generation of electron emitters and "light-speed" electronics are now emerging. This thesis explores two such areas in detail: the generation and characterization of attosecond pulses of light, and strong-field photoemission from nanostructures.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2015

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Keathley, Phillip Donald, 1986-

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/101463
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/101463

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Keathley, Phillip Donald, 1986-. Engineering strong-field phenomena : from attosecond pulse characterization to nanostructured electron emitters. Massachusetts Institute of Technology, 2015. http://hdl.handle.net/1721.1/101463