Commissioning a Novel Quad Near Field Detector for High Energy X-Ray Diffraction Microscopy with Preliminary Applications to an Aluminum Alloy

The focus of this work is the commissioning of the Quad Near Field Detector (QNFD) for High Energy Diffraction Microscopy (HEDM) and show its usefulness for material science. A promising feature of such detectors is that they enable non-destructive, in-situ studies of material systems. This design has four times the active area of comparable detectors, allowing for longer working distances or the collection of greater scattering angles. The QNFD was characterized at the Advanced Photon Source using a gold calibrant. All four quadrants of the QNFD were refined independently, with detector translation errors ≤ ±1 μm vertically and ≤ ±3 μm horizontally. An investigation into the microstructure of a novel aluminium alloy designed for high thermal and electrical conductivity was also completed. With diffraction projections collected by the QNFD, a reconstruction of the alloys primary phase aluminium grains was attained. Evidence of a network of intermetallic phases can be seen in these reconstructions. A high contrast filter applied during post processing to highlight this network. The reconstructions display primary phase grain and secondary dendritic arm behaviour. Future improvements and potential experiments for the QNFD are discussed.

Grantor dc:publisher

University of Guelph

Author dc:creator

• Annett, Scott

Advisor dc:contributor.advisor

• Kycia, Stefan

• quad near field detector
• high energy x-ray diffraction microscopy
• aluminum alloy

Language dc:language.iso

en

Handle dc:identifier.uri

https://hdl.handle.net/10214/26825

OAI record oai:identifier

https://atrium.lib.uoguelph.ca/server/oai/request?verb=GetRecord&metadataPrefix=dim&identifier=oai%3Aatrium.lib.uoguelph.ca%3A10214%2F26825